Semiconductor Wafer and Chip Inspection Equipment

DaiHan DH.Chi0020 -20℃+40℃ Heavy-duty Refrigerated External Circulator/Chiller, 17Lit, 230V 60Hz(=SL.Chi0020)

PEGO ESD-2005Q Electrostatic Discharge Generator (LCD Display) (0.1－30kV ±3％, 0.1－30kV ±3％)

PEGO ESD-2000Q Electrostatic Discharge Generator (LCD Display) (0.1－20kV ±3％, 0.1－20kV ±3％)

PEGO ESD-2005 Electrostatic Discharge Generator (0.5～30kV±3％)

PEGO ESD-2000 Electrostatic Discharge Generator (0.1～20kV±3％)

Tekbox TBESDT2 Current sensing transducer (1 Ω ± 1%, DC – 4 GHz)

Tekbox TBESDT1 Current sensing transducer (2.08 Ω ± 1%, DC – 4 GHz)

Nordson SQ3000+ Automated Optical Inspection

SPIROX MA6503D Micro Inspection System (300μm ~ 2000μm, 8- and 12-inch wafer)

SPIROX MA6500 Macro Inspection System (300μm ~ 2000μm, 8 and12 inch)

SPIROX HED-G5000 Automatic ESD Tester (10MHz, 0.5 ~ 5V)

SPIROX SP3055A Non-Destructive Inspection System for SiC Crystal Killer-Defects (2” 4” 6” 8”, 300 μm - 550 μm)

SPIROX SP8000A Laser Scanning Confocal Measurement Development Platform (50X FOV 200μm x 200μm)

Pintech TEH-10020(Touchscreen version) 20kV Electrostatic discharge generator (Touchscreen version, 0.1～20.0kV±5%)

Pintech TEH-10030(Touchscreen version) 30kV Electrostatic discharge generator (Touchscreen version, 0.1～30.0kV±5%)

Pintech TEH-10030(Button version) 30kV Electrostatic discharge generator (Button version, 0.1～30.0kV±5%)