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Unique benefits for both design and production
Ultra high, repeatable accuracy - 30 nm PV (3σ)
Best available stability - Power variation < ± 15 nm (3σ), PV variation < ± 1.5 nm (3σ)
Analyse geometric features - Such as interlocks and edge diameters in relation to each other or the optical surface
Thin transparent substrates - Down to 100 μm thickness
Fast measurement speeds for true 3D - < 120 sec. - Optical surface and geometric features*, < 60 sec. - Optical surface only**
Measure cellphone lenses in <60 seconds
The world’s fastest and most accurate system, for non-contact 3D cell phone lens metrology.
The LUPHOScan SL is ideal for high volume production of small lenses with key benefits of the system including ultra fast measurement speeds and the ability to measure geometric lens features, such as interlock surface roundness, flatness of the flat lens surface and location of the optical surface relative to these features.
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