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Energy dispersive X-ray fluorescence (XRF) spectrometer for automated material analysis and non-destructive measurement of coating thickness according to ISO 3497 and ASTM B 568
Smallest measuring spot XDL: approx. 0.2 mm
Measuring distance 0 … 80 mm
Tungsten X-ray tube as an x-ray source
Proven proportional counter tube detectors for fast measurement
Fixed or automatically exchangeable primary filters
Fixed sample support
Max. sample weight 20 kg (44 lb)
Max. sample height 155/90/25 mm or 300/235/170 mm (with removed sample support plate)
Slotted housing for measuring on large printed circuit boards
Video camera for easy fixing of the measurement location
Patented by Fischer: the DCM method for simple and fast adjustment of the measuring distance
Certified full-protection devices
Applications
Electroplated, galvanized coatings such as zinc on iron as corrosion protection
Serial testing of mass-produced parts
Analysis of the composition of special steels, e.g. detection of molybdenum in A4
Decorative chrome coatings, e.g. Cr/Ni/Cu/ABS
All typical chrome coatings – also new ones such as CrVI
Measurement of functional gold coatings on printed circuit boards such as Au/Ni/Cu/PCB or Sn/Cu/PCB
Coatings on connectors and contacts in the electronics industry such as Au/Ni/Cu and Sn/Ni/Cu
Datasheet
Brochure
