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XRF measuring instrument fulfils X-ray standards DIN ISO 3497 and ASTM B 568
Non-destructive material analysis and coating thickness measurement of very thin coatings
Fischer digital pulse processor DPP+ and sensitive Silicon drift detector (SDD) for maximum presicion, high resolution and short measuring times
4x changeable aperture (collimator): Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 1 mm (39.4 mils), Ø 3 mm (118 mils)
3x changeable primary filter
Manually adjustable sample table (scissors table) for quick and easy sample positioning
Laser pointer as positioning aid supports the quick alignment of the sample
High-resolution color video camera simplifies the precise determination of the measurement area
Operation, evaluation of measurements and clear presentation of measured values via user-friendly Fischer WinFTM® software
