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Universal X-ray fluorescence (XRF) spectrometers for metal and precious-metal analysis, coating thickness measurement and RoHS screening according to DIN ISO 3497 and ASTM B 568
Premium semiconductor detectors (SDD) ensure excellent detection accuracy and high resolution
Collimator: fixed or 1x changeable, smallest measuring spot approx. 0.1mm
Primary filter: fixed 1x changeable
Fixed sample support or a manual XY stage
Video camera for easy location of the best measurement site
Up to 17 cm sample height
Applications
Non-destructive analysis of dental alloys, silver test
Multilayer coatings
Analysis of functional coatings at least 10 nm thick in the electronics and semiconductor industry
Trace analysis in consumer protection, e.g. testing for the presence of lead in toys
Metal-alloy determinations according to the highest accuracy requirements in the jewelry industry and in refineries
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