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Continuous measurement in running processes with connection to production control systems
Flexible use: for measurements in vacuum or in air; for sample temperatures up to 400°C
Optionally available with water cooling
Particularly robust design and construction for sustainably precise measurements under harsh conditions
Outstandingly well-suited to coating thickness measurement and material analysis on products with large surfaces
X-ray source, detector and primary filter can all be selected by the customer
Systems comply with DIN ISO 3497 and ASTM B 568
Applications
Thickness of CIGS, CIS, CdTe and CdS layers in the solar industry
Thin layers just a few µm thick on metal strips, metallic foils and plastic foils
Composition of CIGS, CIS, CdTe and CdS layers in photovoltaics
Coating thickness control in continuous production
Process monitoring in sputter and electroplating plants
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